Scanning Electron Microscopes

Scanning Electron Microscopes are used for image analysis and for microanalysis of elemental composition. Microanalysis can be performed by Energy Dispersive Spectroscopy or by Wavelength dispersive Spectroscopy.

Typical components of electron microscopes are shown in photographs of the Cambridge S200 and the Cambridge S360

---

www.nucleonics-online.com/682.html
Last revised on 20 July 1999 - Send comments to the Webmaster